Difference between revisions of "Aod ntuple"
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| Comment | | Comment | ||
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− | + | | rowspan="24" valign="top" | ElectronCollection | |
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| n_elec | | n_elec | ||
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| Number of electrons in the Ntuple | | Number of electrons in the Ntuple | ||
|- | |- | ||
− | |||
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| px_elec | | px_elec | ||
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| Px | | Px | ||
|- | |- | ||
− | |||
| | | | ||
| py_elec | | py_elec | ||
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|- | |- | ||
| | | | ||
− | + | | pz_elec | |
− | |pz_elec | ||
| Double | | Double | ||
| Pz | | Pz | ||
|- | |- | ||
− | |||
| | | | ||
| pt_elec | | pt_elec | ||
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| Pt | | Pt | ||
|- | |- | ||
− | |||
| | | | ||
| eta_elec | | eta_elec | ||
Line 52: | Line 47: | ||
| Eta | | Eta | ||
|- | |- | ||
− | |||
| | | | ||
| phi_elec | | phi_elec | ||
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| Phi | | Phi | ||
|- | |- | ||
− | |||
| | | | ||
| isem_elec | | isem_elec | ||
Line 64: | Line 57: | ||
| <code>isEM</code> flag (see below) | | <code>isEM</code> flag (see below) | ||
|- | |- | ||
− | |||
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| hastrk_elec | | hastrk_elec | ||
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| <code>HasTrack</code> flag: presence of charged track in the Inner Detector | | <code>HasTrack</code> flag: presence of charged track in the Inner Detector | ||
|- | |- | ||
− | |||
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| z0vtx_elec | | z0vtx_elec | ||
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| Intersection (z) of track with the beam axis | | Intersection (z) of track with the beam axis | ||
|- | |- | ||
− | |||
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| d0vtx_elec | | d0vtx_elec | ||
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| Transverse impact paramter d0 | | Transverse impact paramter d0 | ||
|- | |- | ||
− | |||
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| nblayerhits_elec | | nblayerhits_elec | ||
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| Number of hits in the Pixel B-layer | | Number of hits in the Pixel B-layer | ||
|- | |- | ||
− | |||
| | | | ||
| npixelhits_elec | | npixelhits_elec | ||
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| Number of hits in the Pixel detector | | Number of hits in the Pixel detector | ||
|- | |- | ||
− | |||
| | | | ||
|nscthits_elec | |nscthits_elec | ||
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| Number of hits in the SCT | | Number of hits in the SCT | ||
|- | |- | ||
− | |||
| | | | ||
| ntrthits_elec | | ntrthits_elec | ||
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| Number of hits in the TRT | | Number of hits in the TRT | ||
|- | |- | ||
− | |||
| | | | ||
| ntrththits_elec | | ntrththits_elec | ||
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| Number of high threshold hits in the TRT | | Number of high threshold hits in the TRT | ||
|- | |- | ||
− | |||
| | | | ||
| auth_elec | | auth_elec | ||
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| Algorithm used to create the electron: <code>softe</code> or <code>egamma</code> | | Algorithm used to create the electron: <code>softe</code> or <code>egamma</code> | ||
|- | |- | ||
− | |||
| | | | ||
| eoverp_elec | | eoverp_elec | ||
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| E/P ratio | | E/P ratio | ||
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− | |||
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| etcone_elec | | etcone_elec | ||
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| Energy deposition in a cone dR=0.45 around the electron cluster | | Energy deposition in a cone dR=0.45 around the electron cluster | ||
|- | |- | ||
− | |||
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| etcone20_elec | | etcone20_elec | ||
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| Energy deposition in a cone dR=0.20 around the electron cluster. Standard cone size for ATLFAST | | Energy deposition in a cone dR=0.20 around the electron cluster. Standard cone size for ATLFAST | ||
|- | |- | ||
− | |||
| | | | ||
| etcone30_elec | | etcone30_elec | ||
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| Energy deposition in a cone dR=0.30 around the electron cluster. Currently empty | | Energy deposition in a cone dR=0.30 around the electron cluster. Currently empty | ||
|- | |- | ||
− | |||
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| etcone40_elec | | etcone40_elec | ||
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| Energy deposition in a cone dR=0.40 around the electron cluster | | Energy deposition in a cone dR=0.40 around the electron cluster | ||
|- | |- | ||
− | |||
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| emwgt_elec | | emwgt_elec | ||
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| Weight for electrons (see below) | | Weight for electrons (see below) | ||
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− | |||
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| piwgt_elec | | piwgt_elec |
Revision as of 11:44, 19 May 2005
This page contains basic prescriptions to get physics objects from the AOD and the AOD-based Root ntuple.
Some comments on quality selection cuts will be added as work progresses.
Electron
AOD Container Name | AOD Variable | Ntuple Variable | Variable Type | Comment |
ElectronCollection | n_elec | Int | Number of electrons in the Ntuple | |
px_elec | Double | Px | ||
py_elec | Double | Py | ||
pz_elec | Double | Pz | ||
pt_elec | Double | Pt | ||
eta_elec | Double | Eta | ||
phi_elec | Double | Phi | ||
isem_elec | Int | isEM flag (see below)
| ||
hastrk_elec | Int (bool) | HasTrack flag: presence of charged track in the Inner Detector
| ||
z0vtx_elec | Double | Intersection (z) of track with the beam axis | ||
d0vtx_elec | Double | Transverse impact paramter d0 | ||
nblayerhits_elec | Int | Number of hits in the Pixel B-layer | ||
npixelhits_elec | Int | Number of hits in the Pixel detector | ||
nscthits_elec | Int | Number of hits in the SCT | ||
ntrthits_elec | Int | Number of hits in the TRT | ||
ntrththits_elec | Int | Number of high threshold hits in the TRT | ||
auth_elec | Int??? | Algorithm used to create the electron: softe or egamma
| ||
eoverp_elec | Double | E/P ratio | ||
etcone_elec | Double | Energy deposition in a cone dR=0.45 around the electron cluster | ||
etcone20_elec | Double | Energy deposition in a cone dR=0.20 around the electron cluster. Standard cone size for ATLFAST | ||
etcone30_elec | Double | Energy deposition in a cone dR=0.30 around the electron cluster. Currently empty | ||
etcone40_elec | Double | Energy deposition in a cone dR=0.40 around the electron cluster | ||
emwgt_elec | Double | Weight for electrons (see below) | ||
piwgt_elec | Double | Weight for pions (see below) |
There are 3 types of quality cuts you can perform on the electron candidates:
- Cuts based on the
isEM
flag - Cuts based on likelihood
- Cuts based on NeuralNet output
1.
The isEM
flag uses both calorimeter and tracking information in addition to TRT
information. The flag is a bit field which marks whether the candidate passed or not some safety checks.
The bit field marks the following checks:
Cluster based egamma
ClusterEtaRange = 0,
ClusterHadronicLeakage = 1,
ClusterMiddleSampling = 2,
ClusterFirstSampling = 3,
Track based egamma
TrackEtaRange = 8,
TrackHitsA0 = 9,
TrackMatchAndEoP = 10,
TrackTRT = 11
In 9.0.4 there is a problem with TRT simulation so one has to mask TRT bit to recover the lost efficiency.
To get the flag in your AOD analysis you should use:
(*elec)->isEM()
To mask the TRT bits you should use: (*elec)->isEM()&0x7FF==0
If you use isEM
then you will select electrons with an overall efficiency of about
80% in the barrel but much lower in the crack and endcap.
2.
The likelihood ratio is constructed using the following variables: energy in different calorimeter samplings, shower shapes in both eta and phi and E/P ration. No TRT information is used here.
You need to access two variables called emweight
and pionweight
then you can construct the likelihood ratio, defined by: emweight/(emweight+pionweight)
.
In AOD, you use the following code:
ElecEMWeight = elec*->parameter(ElectronParameters::emWeight);
ElecPiWeight = elec*->parameter(ElectronParameters::pionWeight);
Then form the variable:
X = ElecEMWeight/(ElecEMWeight+ElecPiWeight);
Requiring X > 0.6 will give you more than 90% efficiency for electrons.
3.
The NeuralNet variable uses as inputs the same variables used for likelihood. To use it in AOD you should proceed as follow:
ElecepiNN = elec*->parameter(ElectronParameters::epiNN);
Requiring ElecepiNN > 0.6 will give you about 90% eff for electrons.
However, you should be aware that the NN was trained in full eta range while the likelihood was computed in 3 bins in eta: barrel, crack and endcap. So I would suggest to use likelihood for now.