Test pulse delay scan datasets

Overview of test pulse delay scan measurements. Data is located at /dcache/detrd/kheijhoff/frontEndAnalysis/data and at sparida.nikhef.nl:/localstore/TPX3/DATA/tpDelayScan.

Digital test pulses

Bias: 20V
Delay step size: 10 ps

Device ID Filename Delay range [ns]
W0011_I05 W0011_I05-201021-225008+0200.root 25
W0039_I11 W0039_I11-201202-221434+0100.root 25
W0039_I11 W0039_I11-201217-183703+0100.root 28
W0011_I05 W0011_I05-201224-142534+0100.root 28

Charge scans

W0011_I05

Bias: 20V
Delay step size: 100 ps
Treshold : 645 e?

Filename Charge [ke]
W0011_I05-210112-143234+0100.root 17.4
W0011_I05-210110-175303+0100.root 17
W0011_I05-210110-112805+0100.root 16
W0011_I05-210109-122359+0100.root 15
W0011_I05-210108-152810+0100.root 14
W0011_I05-210108-001710+0100.root 13
W0011_I05-210107-164953+0100.root 12
W0011_I05-210107-111517+0100.root 11
W0011_I05-201027-165919+0100.root 10
W0011_I05-201031-024516+0100.root 9
W0011_I05-201030-165848+0100.root 8
W0011_I05-201030-091934+0100.root 7
W0011_I05-201030-022142+0100.root 6
W0011_I05-201029-011639+0100.root 5
W0011_I05-201031-133944+0100.root 4
W0011_I05-201031-195824+0100.root 3
W0011_I05-201101-131444+0100.root 2
W0011_I05-201101-215800+0100.root 1

W0039_I11

Bias: 20V
Delay step size: 100 ps
Treshold : 645 e?

Filename Charge [ke]
W0039_I11-201209-164236+0100.root 17.9
W0039_I11-210118-180840+0100.root 17
W0039_I11-210118-115820+0100.root 16
W0039_I11-210117-191534+0100.root 15
W0039_I11-210117-104538+0100.root 14
W0039_I11-210116-130132+0100.root 13
W0039_I11-210115-192647+0100.root 12
W0039_I11-210115-124319+0100.root 11
W0039_I11-201207-201658+0100.root 10
W0039_I11-201208-131957+0100.root 9
W0039_I11-201210-110225+0100.root 8
W0039_I11-201214-111215+0100.root 7
W0039_I11-201215-115741+0100.root 6
W0039_I11-201216-221625+0100.root 5
W0039_I11-201222-134347+0100.root 4
W0039_I11-201222-203316+0100.root 3
W0039_I11-201223-144858+0100.root 2
W0039_I11-201207-122617+0100.root 1

Topic revision: r11 - 2021-01-27 - LaurensHendrikx
 
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