GridPix R&D
TimePix3 GridPix Detectors
TimePix3 GridPix Detectors
Timepix GridPix Detectors
Timepix GridPix Detectors
Before wafer scale production
IZM-2 batch
Put here the experience with the IZM-2 GridPix batch at Nikhef and important conclusions.
IZM-3 batch W0056-TPX
Put here the experience with the IZM-3 Gridpix batch at Nikhef and important conclusions.
For the whole batch the wafer ID is W0056-TPX and the SiRN thickness is 8 µm. The list items are in order of the GelPack from top left to bottom right.
ChipID |
Board type |
Drift length (mm) |
Setup |
Remarks |
B06 |
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C06 |
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D06 |
DARWIN PCB-A |
soon 60 |
Gain measurement setup |
digital test and THL Equ. OK |
D10 |
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E10 |
ReNext |
1 |
Testbeam setup |
Gossip 1 |
F04 |
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F10 |
ReNext |
1 |
Testbeam setup |
Gossip 2 |
H10 |
ReNext |
16 |
Laser setup |
long term test at 620 (later 650) V grid voltage |
I06 |
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J02 |
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J04 |
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J06 |
ReNext |
1 |
Testbeam setup |
Gossip 3 |
J08 |
ReNext |
1 |
Testbeam setup |
Gossip 4 |
K04 |
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K06 |
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M06 |
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Measuring the height of the amplification gap
Here at Nikhef Fred Hartjes usually uses an optical microscope: focusing on the grid surface and separately on a pixel inside a hole results in a difference of ocular units, 1 unit corresponding to 1.25 micron. Fred, Harry vd Graaf and Wilco Koppert were measuring the gap on several of the IZM-3 chips using this method. They found values of 62 up to 95 micron. Those results would indicate an inaccuracy in the production both in absolute as well as in the spread of achieved heights.
This is why we asked Yevgen Bilevych of what values he found:
- There is an SU-8 thickness map automatically generated after the spin coating (thus before the baking), see the SU-8 profile. Although not quite clear why the thickness distribution has this shape (maxima lying at roughly half the radius) it lies in a well-defined region between 56 and 64 micron. According to Yevgen this thickness should even reduce a bit during the final softbaking step. Note the position of the "notch" in the display and the chip coordinates.
- In this microscope picture you see a direct measurement of the pillar height of chip H03 (of pillars after stripping the grid) with the help of an optical microscope. The chip H03 lies in the region of higher thickness of 63 to 64 micron in the SU-8 map.
Concluding, two independent measurements indicate a thickness of 65 micron maximum and one estimating a gap height considerably higher which leads us to believe that there may be systematic errors in the (microscopic) focussing method.
--
RolfS - 2012-10-17
Topic attachments
I |
Attachment |
Action |
Size |
Date |
Who |
Comment |
pdf |
Darwin_progress-June-2012.pdf |
manage |
671.1 K |
2012-06-15 - 09:12 |
NielsVanBakel |
Fred Hartjes RD51 |
png |
G1_E10_W0056-10000evts_560Vgrid_760VCath_Sr90_CO2DME_ToT.png |
manage |
388.5 K |
2012-09-21 - 17:50 |
UnknownUser |
Gossip 1; VGrid=-560V, VCath=-760V, 10000 evts occupancy plot, Sr-90, C02DME (50:50) |
png |
G2_F10_W0056-10000evts_560Vgrid_760VCath_Sr90_CO2DME_ToT.png |
manage |
354.9 K |
2012-09-21 - 17:54 |
UnknownUser |
Gossip 2; VGrid=-560V, VCath=-760V, 10000 evts occupancy plot, Sr-90, C02DME (50:50) |
png |
G3_J06_W0056-2000evts_560Vgrid_760VCath_Sr90_CO2DME_ToT.png |
manage |
347.3 K |
2012-09-25 - 15:56 |
UnknownUser |
|
png |
G4_J08_W0056-2000evts_560Vgrid_760VCath_Sr90_CO2DME_ToT.png |
manage |
367.7 K |
2012-09-25 - 16:02 |
UnknownUser |
|
jpg |
Gossip3.jpg |
manage |
362.9 K |
2012-10-11 - 13:04 |
UnknownUser |
|
png |
H10integral.png |
manage |
261.3 K |
2012-09-04 - 14:01 |
UnknownUser |
Integral chip H10, 1000 events of 0.1 second, ToT, 480 V grid, CO2 DME (50:50), 600 V Drift field, 2 cm drift gap |
pdf |
IZM-3-E85MXGXpicsA.pdf |
manage |
33144.7 K |
2012-09-03 - 14:33 |
UnknownUser |
pics IZM 3 series |
pdf |
IZM-3-E85MXGXpicsB.pdf |
manage |
28815.8 K |
2012-09-03 - 14:34 |
UnknownUser |
pics IZM 3 series |
pdf |
Overview.pdf |
manage |
62.7 K |
2012-11-26 - 15:32 |
UnknownUser |
Data sets taken at November 2012 test beam @ CERN |
pdf |
Update_Gridpix_production-June2012.pdf |
manage |
2349.9 K |
2012-06-15 - 09:10 |
NielsVanBakel |
Fred Hartjes RD51 |
pdf |
report_brokenGridPix.pdf |
manage |
5331.6 K |
2014-11-19 - 23:26 |
UnknownUser |
|
pdf |
testbeam2012.pdf |
manage |
655.3 K |
2012-11-26 - 17:37 |
UnknownUser |
Overview dead chips testbeam November 2012 @ CERN |